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| 美国GE CT(hispeed NX/i)数据采集系统原理分析及故障判别 | |
| 引用本文： | 翟玉人,赵伟,高晶,刘宏光.美国GE CT(hispeed NX/i)数据采集系统原理分析及故障判别[J].沈阳师范大学学报(自然科学版),2011,29(4):503-505. |
| 作者姓名： | 翟玉人 赵伟 高晶 刘宏光 |
| 作者单位： | 1. 沈阳师范大学物理科学与技术学院,沈阳,110034 2. 辽阳中心医院,辽宁辽阳,111000 3. 沈阳师范大学数学与系统科学学院,沈阳,110034 |
| 基金项目： | 辽宁省教育厅科学研究资助项目(L2010521) |
| 摘 要： | Hispeed NX/i是美国GE公司生产的双排螺旋CT,属大型精密医疗设备,系多学科知识的综合产物,工作原理十分复杂。数据采集系统(DAS)是该设备中的关键部分,其精度、稳定性、可靠性及工作状态直接影响图像的质量。因此,数据采集系统(DAS)的组成及工作原理对使用及维护人员十分重要。文中对美国GE CT(hispeed NX/i)数据采集系统的组成、工作原理进行了分析,并根据其工作特点介绍了该系统中典型故障的判别及"数据测试图形"检测法。依据该判别及检测方法可提高GE CT(hispeed NX/i)数据采集系统故障点的检测速度和准确率。 |
| 关 键 词： | CT 数据采集系统 通道 伪影 |
Principle analysis and fault diagnosis of American GE CT(hispeed NX/i) data collection system |
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| ZHAI Yu-ren,ZHAO Wei,GAO Jing,LIU Hong-guang.Principle analysis and fault diagnosis of American GE CT(hispeed NX/i) data collection system[J].Journal of Shenyang Normal University: Nat Sci Ed,2011,29(4):503-505. | |
| Authors: | ZHAI Yu-ren ZHAO Wei GAO Jing LIU Hong-guang |
| Institution: | ZHAI Yu-ren1,ZHAO Wei2,GAO Jing3,LIU Hong-guang2(1.College of Physics Science and Technology,Shenyang Normal University,Shenyang 110034,China,2.Liaoyang Central Hospital,Liaoyang 111000,3.College of Mathematics and Systems Science,China) |
| Abstract: | Hispeed NX/i is a double row helical CT produced by American GE Corporation which is a large-scale precision instrument based on a combination of knowledge from many fields and has very complicated working principle.For this equipment,the data acquisiton system(DAS) is the critical part since its accuracy, stability and reliability will directly affect the image quality.Therefore,the composition and principle of the data acquisiton system(DAS) are very important to the users and maintainers.This paper analy... |
| Keywords: | CT data acquisiton system channel artifact |
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