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X-Ray Diffraction Characterization of the Microstructure in Close-Packed Hexagonal Nano Material
摘    要:1 Results On the basis of previous work,the general theory,least square methods and computing programs have been proposed and developed,which can separate the two-fold broadening effect caused by crystallite-micro strain,crystallite-stacking faults,strain-faults and which can also separate the three fold broadening effect caused by crystallite-strain-faults in closed-parked hexagonal (CPH) nano-materials.The method is applied to characterize and investigate the microstructure in β-Ni(OH)2 as negative material for nickel/metal (Ni /MH) batteries.The results indicate that in the raw β-Ni(OH)2 there are only two-fold broadening effect of crystallite-faults,however after activation and cycle test three fold broadening effect of crystallite-strain-faults is available.

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