Radiation hardness characterization of low gain avalanche detector prototypes for the high granularity timing detector

The high granularity timing detector (HGTD) is a crucial component of the ATLAS phase II upgrade to cope with the extremely high pile-up (the average number of interactions per bunch crossing can be as high as 200). With the precise timing information (σ_t～30 ps) of the tracks, the track-to-vertex association can be performed in the “4-D” space. The Low Gain Avalanche Detector (LGAD) technology is chosen for the sensors, which can provide the required timing resolution and good signal-to-noise ratio. Hamamatsu Photonics K.K. (HPK) has produced the LGAD with thicknesses of 35 μm and 50 μm. The University of Science and Technology of China(USTC) has also developed and produced 50 μm LGADs prototypes with the Institute of Microelectronics (IME) of Chinese Academy of Sciences. To evaluate the irradiation hardness, the sensors are irradiated with the neutron at the JSI reactor facility and tested at USTC. The irradiation effects on both the gain layer and the bulk are characterized by I-V and C-V measurements at room temperature (20 ℃) or ?30 ℃. The breakdown voltages and depletion voltages are extracted and presented as a function of the fluences. The final fitting of the acceptor removal model yielded the c-factor of 3.06×10?16 cm?2, 3.89×10?16 cm?2 and 4.12×10?16 cm?2 for the HPK-1.2, HPK-3.2 and USTC-1.1-W8, respectively, showing that the HPK-1.2 sensors have the most irradiation resistant gain layer. A novel analysis method is used to further exploit the data to get the relationship between the c-factor and initial doping density.