首页 | 本学科首页   官方微博 | 高级检索  
     

电阻耦合单电子晶体管电学性能分析
引用本文:杨涛,蒋建飞,蔡琪玉. 电阻耦合单电子晶体管电学性能分析[J]. 上海交通大学学报, 2002, 36(6): 807-811
作者姓名:杨涛  蒋建飞  蔡琪玉
作者单位:上海交通大学,微米/纳米科学技术研究院,上海,200030
基金项目:国家自然科学基金 (69890 2 2 4),上海 AM基金(980 0 9)资助项目
摘    要:基于单电子系统半径经典模型,分析了电阻耦合单电子晶体管的电学特性,得到其电学性能不随背景电荷分布变化的特点,通过时域特性分析,指出了时延参数τ=C∑Rg,并用Monte-Carlo法对其构成的反相器进行了模拟验证。

关 键 词:电学性能 单电子晶体管 电阻耦合 时域特性分析 背景电荷 时延参数
文章编号:1006-2467(2002)06-0807-05
修稿时间:2001-06-29

Electrical Characteristic Analysis of Resistively Coupled Single-Electron Transistor
YANG Tao,JIANG Jian fei,CAI Qi yu. Electrical Characteristic Analysis of Resistively Coupled Single-Electron Transistor[J]. Journal of Shanghai Jiaotong University, 2002, 36(6): 807-811
Authors:YANG Tao  JIANG Jian fei  CAI Qi yu
Abstract:According to the semi classical model, by means of electrical characteristics analysis of R SET, it was proposed that the electrical performance of R SET was not affected by the background charge. The time domain characteristics of R SET was analyzed, and its delay parameter was pointed out. Simulations of the inverter based on R SET using Monte Carlo means were accomplished for the validation.
Keywords:single electron transistor(SET)  resistively couple  time domain characteristics analysis  background charge
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号