| 纳米级集成电路的软错误问题及其对策 |
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| 引用本文： | 张民选,孙岩,宋超. 纳米级集成电路的软错误问题及其对策[J]. 上海交通大学学报, 2013, 47(1): 1-6 |
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| 作者姓名： | 张民选 孙岩 宋超 |
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| 作者单位： | (国防科学技术大学 计算机学院， 长沙 410073) |
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| 摘 要： | 介绍了纳米级集成电路中软错误的发生机制、发展趋势以及评估技术，概括了软件、电路和体系结构以及工艺器件级软错误的缓解对策，并针对软错误问题相关研究的发展提出几点建议.
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| 关 键 词： | 软错误 集成电路 可靠性 |
| 收稿时间： | 2012-05-30 |
Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits |
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| ZHANG Min-xuan,SUN Yan,SONG Chao. Soft Error Problem and Countermeasure in Nanometer Scale Integrated Circuits[J]. Journal of Shanghai Jiaotong University, 2013, 47(1): 1-6 |
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| Authors: | ZHANG Min-xuan SUN Yan SONG Chao |
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| Affiliation: | (College of Computer, National University of Defense Technology, Changsha 410073, China) |
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| Abstract: | This paper described the mechanism, trends and evaluation techniques of soft errors in nanometer scale integrated circuits. For solving the soft error problems, the paper summed up the countermeasures across the software level, circuit and architecture level as well as process device level. At last, some suggestions on the development of related studies on soft error problems were put
forward. |
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| Keywords: | soft error integrated circuits reliability |
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