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织物疵点检测中自适应正交小波基的构造
引用本文:祝双武,郝重阳,齐华. 织物疵点检测中自适应正交小波基的构造[J]. 西安工程科技学院学报, 2007, 21(2): 212-215
作者姓名:祝双武  郝重阳  齐华
作者单位:[1]西北工业大学电子信息学院,陕西西安710072 [2]西安工程大学纺织与材料学院,陕西西安710048
摘    要:提出了一种用于织物疵点检测的自适应正交小波基的构造方法.该方法从小波滤波器系数满足的正交归一化条件入手,采用一定数量参数角的正弦和余弦函数构造出一定长度的正交小波滤波器系数的统一解析式;以分解子图中像素最大能量值最小作为逼近条件,采用遗传算法作为寻优算法,从而实现针对不同的织物,自适应地构造小波基.同时,实验证明了自适应小波基的对疵点图像分解效果.

关 键 词:自适应小波基  构造  疵点检测  遗传算法
文章编号:1671-850X(2007)02-0212-04
收稿时间:2007-03-06
修稿时间:2007-03-06

Construction of adapted orthogonal wavelet bases for fabric defect inspection
ZHU Shuang-wu,HAO Chong-Yang,QI Hua. Construction of adapted orthogonal wavelet bases for fabric defect inspection[J]. Journal of Xi an University of Engineering Science and Technology, 2007, 21(2): 212-215
Authors:ZHU Shuang-wu  HAO Chong-Yang  QI Hua
Abstract:A new construction method of adapted orgthogonal wavelet bases for fabric defect inspection is proposed in this paper. In the method, an arbitrary length wavelet filter coefficients with orthgonality and normalization can be constructed to uniform analytic form by using sine and cosine trigonometric functions of some parameters. Adapted wavelet bases are selected for different fabric by using max of each pixel gray in decomposed sub-image being minimum as sufficient condition, and genetic algorithm as optimization method. The decomposed validity of the adapted wavelet is proved by experimental resuits.
Keywords:adapted wavelet bases   construction   defect inspection    genetic algorithm
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