|
|||||
|
|
| 基于结构谱的中厚板表面缺陷识别方法 | |
| 引用本文： | 宋强,徐科,徐金梧.基于结构谱的中厚板表面缺陷识别方法[J].北京科技大学学报,2007,29(3):342-345. |
| 作者姓名： | 宋强 徐科 徐金梧 |
| 作者单位： | 1. 北京科技大学高效轧制国家工程研究中心;中国石油大学(北京)机电工程学院,北京,102249 2. 北京科技大学高效轧制国家工程研究中心 3. 北京科技大学机械工程学院,北京,100083 |
| 基金项目： | 国家高技术研究计划发展专项经费 |
| 摘 要： | 为克服传统纹理分析的缺陷识别结果易受光照变化和氧化铁皮不利影响的缺点,提出了结构谱纹理分析方法,并将其应用于中厚板表面麻点、夹杂、结疤等缺陷的识别.实验结果表明,结构谱方法具有较好的光照不变性,对麻点、夹杂、结疤等缺陷的识别率要高于灰度共生矩阵、Laws纹理能量、傅里叶功率谱等其他纹理分析方法. |
| 关 键 词： | 中厚板 表面检测 结构谱 纹理分析 结构 中厚板 表面缺陷 识别方法 spectrum structure based plates medium surface defects 傅里叶功率谱 纹理能量 Laws 灰度共生矩阵 识别率 表面麻点 光照不变性 谱方法 实验 结疤 |
| 修稿时间： | 2005-12-19 |
Recognition of surface defects on medium and heavy plates based on structure spectrum |
|
| SONG Qiang,XU Ke,XU Jinwu.Recognition of surface defects on medium and heavy plates based on structure spectrum[J].Journal of University of Science and Technology Beijing,2007,29(3):342-345. | |
| Authors: | SONG Qiang XU Ke XU Jinwu |
| Institution: | 1 National Engineering Research Center for Advanced Rolling Technology, University of Science and Technology Beijing, Beijing 100083, China; 2 Department of Mechanical and Electronic Engineering, China University of Petroleum (Beijing |
| Abstract: | In surface inspection of medium and heavy plates, defects recognition based on texture analysis suffers from mutative illuminations and scales. An illumination invariant texture analysis method named structure spectrum was proposed and applied to recognition of surface defects on medium and heavy plates. Compared with other textural features such as gray level co-occurrence matrix, Laws texture energy, and Fourier power spectrum, higher classification rates were made by structure spectrum for classification of pits, scars and inclusions. |
| Keywords: | medium and heavy plate surface inspection structure spectrum texture analysis |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |