| An Approach to the Fault Diagnosis and Testability in Analog Circuits at Module Level |
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| 作者姓名： | Yang Jiawei |
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| 作者单位： | Yang Jiawei (Beijing Institute of Remote Sensing Equipment，Beijing 100854，PRC)Yang Shiyuan ;and Tong.Shibai(Department of Automation，Tsinghua University，Beijing 100084，PRC) |
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| 摘 要： | ＡｎＡｐｐｒｏａｃｈｔｏｔｈｅＦａｕｌｔＤｉａｇｎｏｓｉｓａｎｄＴｅｓｔａｂｉｌｉｔｙｉｎＡｎａｌｏｇＣｉｒｃｕｉｔｓａｔＭｏｄｕｌｅＬｅｖｅｌＹａｎｇＪｉａｗｅｉ（ＢｅｉｊｉｎｇＩｎｓｔｉｔｕｔｅｏｆＲｅｍｏｔｅＳｅｎｓｉｎｇＥｑｕｉｐｍｅｎｔ，Ｂ...
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An Approach to the Fault Diagnosis and Testability in Analog Circuits at Module Level |
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| Yang Jiawei.An Approach to the Fault Diagnosis and Testability in Analog Circuits at Module Level[J].Journal of Systems Engineering and Electronics,1994(2). |
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| Authors: | Yang Jiawei |
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| Abstract: | In this paper, a module level fault diagnosis method is presented which considers multi-port device or subnetwork as the basic unit. The fault model in this method is quite similar to an actual condition,hence it has practical meaning. The equations of moedule level fault diagnosis are derived, and thetestability problem for module-fault diagnosis is discussed in general. The paper then gives severaltoplolgical conditions for module-fault testubility, which are applicable to a general nonreciprocal network by introducing a generalized independent path. |
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| Keywords: | Fault diagnosis Module Testability Topological condition Independent path |
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