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原子力显微镜探针自动逼近系统设计与应用
引用本文:周凯波,黄毛毛,殷玉娟.原子力显微镜探针自动逼近系统设计与应用[J].科技导报(北京),2009,27(18):43-46.
作者姓名:周凯波  黄毛毛  殷玉娟
作者单位:天津大学,精密测试技术及仪器国家重点实验室,天津,300072 
摘    要:设计出一套能独立运作的原子力显微镜(AFM)探针自动逼近系统,可广泛应用于大部分原子力显微扫描系统的独立开发.逼近过程中,通过VB的串口通讯发送指令控制单片机采集AFM微悬臂梁的偏转信号,并传送到计算机进行分析显示,实时监测探针与样品之间的作用力,最终实现探针的自动逼近.该系统可与多种相关原子力显微镜设备组合应用,达到个性化多功能检测的目的.

关 键 词:原子力显微镜  步进电机  逼近系统  数据采集

Design and Application of Auto-feeding System for Atomic Force Microscopy Probe
ZHOU Kaibo,HUANG Maomao,YIN Yujuan State Key Laboratory of Precision Measuring Techniques , Instruments,Tianjin University,Tianjin ,China.Design and Application of Auto-feeding System for Atomic Force Microscopy Probe[J].Science & Technology Review,2009,27(18):43-46.
Authors:ZHOU Kaibo  HUANG Maomao  YIN Yujuan State Key Laboratory of Precision Measuring Techniques  Instruments  Tianjin University  Tianjin  China
Institution:ZHOU Kaibo,HUANG Maomao,YIN Yujuan State Key Laboratory of Precision Measuring Techniques , Instruments,Tianjin University,Tianjin 300072,China
Abstract:Atomic Force Microscope (AFM), one of the most effective and important means of testing and processing in nanometer technology, is receiving increasing popularity in applications related with nanometer technology. The current trend of development of AFM involves its composite function. Direct observation of the surface of the nano-scale morphology is not the only thing AFM can do, it also supports nanofabrication, biological materials testing and even the mechanical property test for nanostructures. Therefo...
Keywords:atomic force microscope  stepping motor  feeding system  data acquisition  
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