| Bi-Spectrum Scattering Model for Dielectric Randomly Rough Surface |
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| 作者姓名： | 刘宁 李宗谦 |
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| 作者单位： | StateKeyLaboratoryonMicrowaveandDigitalCommunications,DepartmentofElectronicEngineering,TsinghuaUniversity,Beijing100084,China |
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| 基金项目： | Supported by the National Natural Science Foundationof China(Nos.4 0 1710 71and4 98710 5 7) |
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| 摘 要： | The bistatic scattering model is often used for remote microwave sensing. The bi-spectrum model (BSM) for conducting surfaces was used to develop a scattering model for dielectric randomly rough surfaces to estimate their bistatic scattering coefficients. The model for dielectric rough surfaces differs from the BSM for a conducting surface by including Fresnell reflection and transmission from dielectric rough surfaces. The bistatic scattering coefficients were defined to satisfy the reciprocal theorem. Values calculated using the BSM for dielectric randomly rough surfaces compare well with those of the integral equation model (IEM) and with experimental data, showing that the BSM accuracy is acceptable and its range of validity is similar to that of IEM while the BSM expression is simpler than that of IEM。
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| 关 键 词： | 电介质 粗糙表面 二倍频谱散射模型 双基地扩散系数 导电面 微波遥感 |
Bi-Spectrum Scattering Model for Dielectric Randomly Rough Surface |
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| LIU Ning,LI ZongqianState Key Laboratory on Microwave and Digital Communications.Bi-Spectrum Scattering Model for Dielectric Randomly Rough Surface[J].Tsinghua Science and Technology,2003,8(5):617-623. |
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| Authors: | LIU Ning LI ZongqianState Key Laboratory on Microwave and Digital Communications |
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| Institution: | LIU Ning,LI ZongqianState Key Laboratory on Microwave and Digital Communications,Department of Electronic Engineering,Tsinghua University,Beijing 100084,China |
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| Abstract: | The bistatic scattering model is offen used for remote microwave sensing. The bi-spectrum model (BSM) for conducting surfaces was used to develop a scattering model for dielectric randomly rough surfaces to estimate their bistatic scattering coefficients. The model for dielectric rough surfaces differs from the BSM for a conducting surface by including Fresnell reflection and transmission from dielectric rough surfaces. The bistatic scattering coefficients were defined to satisfy the reciprocal theorem. Values calculated using the BSM for dielectric randomly rough surfaces compare well with those of the integral equation model (IEM) and with experimental data, showing that the BSM accuracy is acceptable and its range of validity is similar to that of IEM while the BSM expression is simpler than that of IEM. |
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| Keywords: | dielectric randomly rough surface spectral domain bi-spectrum method bistatic scattering coefficients bi-spectrum scattering model microwave remote sensing |
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