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动态测试系统微功耗技术研究
引用本文:郭红英,高雁. 动态测试系统微功耗技术研究[J]. 长春师范学院学报, 2011, 0(8): 50-52
作者姓名:郭红英  高雁
作者单位:忻州师范学院物理与电子系
基金项目:忻州师范学院院级基金(200823)
摘    要:本文介绍了在动态测试系统中实现微功耗的关键技术以及对电路进行优化设计的常用方法;着重阐述了微功耗优化技术的相关内容;在分析现有模拟器件和功耗模型的基础上,从物理逻辑设计、软件编程优化、低功耗映射等方面评述了当前低功耗关键技术,并提出了相关可行的改进方案。

关 键 词:动态测试系统  微功耗  功耗模型  逻辑设计

A Study on the Technology of Micro Power Consumption in Dynamic Test System
GUO Hong-ying,GAO Yan. A Study on the Technology of Micro Power Consumption in Dynamic Test System[J]. Journal of Changchun Teachers College, 2011, 0(8): 50-52
Authors:GUO Hong-ying  GAO Yan
Affiliation:(Department of Physics and Electrons,Xinzhou Teachers University,Xinzhou 034000,China)
Abstract:This paper introduces the key technologies of realizing micro power consumption in dynamic test system and some common methods of optimizing circuit design,and then emphatically describes the related contents of optimization technology of the micro power consumption.Through analyzing the existing analog device and power consumption model,the paper reviews the key technologies of micro power consumption from the aspects of physical logic design,software programming optimization and low-power mapping,and puts forward some feasible improvement schemes.
Keywords:dynamic test system  micro power  power consumption model  logical design
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