| 电子镇流器的可靠性设计 |
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| 引用本文： | 于军,谢基凡,刘刚,周文利.电子镇流器的可靠性设计[J].华中科技大学学报(自然科学版),1996(3). |
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| 作者姓名： | 于军 谢基凡 刘刚 周文利 |
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| 作者单位： | 华中理工大学固体电子学系 |
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| 基金项目： | 国家重点企业技术开发项目 |
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| 摘 要： | 讨论了电子镇流器可靠性设计的有关原理和方法，并从电路网络的固有可靠性设计、降额设计、电磁兼容设计与耐环境设计等方面论述了ＨＵＳＴ－ＹＺ４０ＥＢ型电子镇流器可靠性设计与制造的技术方案．
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| 关 键 词： | 电子镇流器 可靠性 设计 |
The Reliability Design for Electronic Ballasts |
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| Yu Jun,Xie Jifan,Liu Gang,Zhou Wenli.The Reliability Design for Electronic Ballasts[J].JOURNAL OF HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY.NATURE SCIENCE,1996(3). |
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| Authors: | Yu Jun Xie Jifan Liu Gang Zhou Wenli |
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| Abstract: | he principle and methods of the reliability design for electronic ballasts are described. The technical scheme of the design and manufacture of the reliability for type HUST-YZ 40 EB electronic ballasts are discussed from several aspects including the inherent reliability, derating specifications,electro-magnetic compatibility and resistance to tough environment of a circuit network.Theoretical and experimental study shows that the reliability of electronic ballasts can be improved of a VDMOS is used as the variable-frequency swiching device and the protection circuit against over-current and overvoltage, EMI filter circuit,harmonic absorption circuit are provided, with also a suitable derating and careful check and selection of the electronic components and devices made. |
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| Keywords: | electronic ballast reliability design |
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