基于长游程二次编码的测试数据压缩方法

为提高集成电路的测试效率,提出了一种长游程编码的二次压缩方法。该压缩方法的思想是:首先对游程进行一次编码,然后对其中的长游程的编码字进行二次编码。二次编码方法减小了测试编码的长度,从而测试数据得到了进一步的压缩。该方法的硬件开销小,解压方法简单。实验结果表明该方法有效地提高了集成电路测试数据的压缩率。

Test data compression method based on the recoding of long run-length

To improve the test efficiency of integrated circuit,the second compression method of LRL(long run-length) coding was proposed in this paper.The main idea of this method is as following: first the run-length is decoded,then the LRL code is recoded,by which the total length of test code is further reduced,thus test data are further compressed.The hardware overhead in this method is small and the decompression method is simple.The experimental result showed that the method can effectively improve the compression rate of test data of integrated circuit.