首页 | 本学科首页   官方微博 | 高级检索  
     检索      

OVERHAUSER磁力仪灵敏度表征方法研究
引用本文:王超,陈曙东,张爽.OVERHAUSER磁力仪灵敏度表征方法研究[J].吉林大学学报(信息科学版),2016,34(3):401-406.
作者姓名:王超  陈曙东  张爽
作者单位:吉林大学电子科学与工程学院,长春,130012;吉林大学电子科学与工程学院,长春,130012;吉林大学电子科学与工程学院,长春,130012
基金项目:动态激发核磁共振磁力仪技术开发基金资助项目(3R1159121411)
摘    要:为评价OVERHAUSER 磁力仪的综合性能, 同时为质子磁力仪的研发提供理论指导, 研究了灵敏度在时域和频域的表征方法, 并在理论上证明了两种表征方法本质上的一致性; 分析了采样率对灵敏度的影响; 设计实验标定了JPM鄄2 型质子磁力仪的灵敏度。实验结果表明, JPM鄄2 型质子磁力仪灵敏度时域表征为0. 18 nT,频域表征为0. 32 nT/ Hz@0. 1 Hz, 得到了测量数据日变分量、噪声分量的频域分布图。

关 键 词:质子磁力仪  灵敏度  时域  频域  噪声
收稿时间:2015-10-11

Study on Method of Sensitivity Characterization for OVERHAUSER Magnetometer
WANG Chao,CHEN Shudong,ZHANG Shuang.Study on Method of Sensitivity Characterization for OVERHAUSER Magnetometer[J].Journal of Jilin University:Information Sci Ed,2016,34(3):401-406.
Authors:WANG Chao  CHEN Shudong  ZHANG Shuang
Institution:College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Abstract:In order to evaluate the comprehensive performance of OVERHAUSER magnetometer, and provide theoretical guidance for the development of proton magnetometer, the methods of sensitivity characterization of OVERHAUSER magnetometer in time domain and frequency domain are studied. Theoretical research proves that the two methods are essentially consistent. The effect of sample rate on sensitivity is analyzed. Study shows that the signal quality is the main impact on sensitivity. Experiments are designed to calibrate sensitivity of JPM-2 type proton magnetometer, and experimental results indicate that the sensitivity of JPM-2 type proton magnetometer is 0. 18 nT when characterized in time domain, and 0. 32 nT/ Hz@0. 1 Hz when characterized in frequency domain. We obtain the frequency domain distribution figure of measurement data for diurnal variation component and noise component.
Keywords:OVERHAUSER magnetometer  sensitivity  time domain  frequency domain  noise
本文献已被 万方数据 等数据库收录!
点击此处可从《吉林大学学报(信息科学版)》浏览原始摘要信息
点击此处可从《吉林大学学报(信息科学版)》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号