| 应力差分反射对GaAs体材料的应用 |
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| 引用本文： | 陆书龙,代作晓,赵明山,李国华.应力差分反射对GaAs体材料的应用[J].曲阜师范大学学报,1999,25(4):59-60. |
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| 作者姓名： | 陆书龙 代作晓 赵明山 李国华 |
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| 作者单位： | 曲阜师范大学激光研究所!273165，山东省曲阜市，曲阜师范大学激光研究所!273165，山东省曲阜市，曲阜师范大学激光研究所!273165，山东省曲阜市，曲阜师范大学激光研究所!273165，山东省曲阜市 |
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| 摘 要： | 庆力差分反射术是一种调是光谱技术，它的测量机理是对半导体材料施加一非均匀的应力、，使材料的介电函数发生改变，从而产生与材料的光学迁相联系的ＤＲ信号，实现调制的目的，实验结果表明，应力差分反射光谱能够较好地指认均匀性较好材料的量子化跃迁。
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| 关 键 词： | 应力差分反射术 介电函数 差分反射光谱 |
APPLICATION OF STRESS DIFFERENTIAL REFLECTANCE ON THE GaAs BULK MATERIALS |
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| LU Shu-long,DAI Zuo-xiao,ZHAO Ming-shan,LI Guo-hua.APPLICATION OF STRESS DIFFERENTIAL REFLECTANCE ON THE GaAs BULK MATERIALS[J].Journal of Qufu Normal University(Natural Science),1999,25(4):59-60. |
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| Authors: | LU Shu-long DAI Zuo-xiao ZHAO Ming-shan LI Guo-hua |
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| Abstract: | Stress Differential Reflectance (SDR) technique is a modulated technique for measuring the bulk materials with good homogeneities. The dielectric functions of semiconductor materials are changed by giving a inhomogeneous stress to the sample.DR signals relating to optical transition of the materials are resulted from inhomogeneous stress. The experiment demonstrates that SDR spectrum can easily define the quantized transition of the bulk materials with good homogeneities. |
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| Keywords: | Stress Differential Reflectance technique Dielectric function Differential Reflectance Spectrum |
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