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Fabric Defect Detection Technique Based on Two-double Neural Network
Authors:XIE Chun-ping  XU Bo-jun  CHEN Jun-jie
Affiliation:Key Laboratory of Science and Technology of Eco-Textiles Ministry of Education, Jiangnan University, Jiangsu 214122, China
Abstract:This paper introduces the identification of the defects on the fabric by using two-double neural network and wavelet analysis.The purpose is to fit for the automatic cloth inspection system and to avoid the disadvantages of traditional human inspection.Firstly,training the normal fabric to acquire its characteristics and then using the BP neural network to tell the normal fabric apart from the one with defects.Secondly,doing the two-dimensional discrete wavelet transformation based on the image of the defects,then wiping off the proper characteristics of the fabric,and identifying the defects utilizing the trained BP neural network.It is proved that this method is of high speed and accuracy.It comes up to the requirement of automatic cloth inspection.
Keywords:defect identification  wavelet analysis  neural network  quality inspection
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