| 硅点阵常数精确测定及系统误差处理 |
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| 摘 要： | 精确测定点阵常数是研究结晶材料的重要方法之一，对于研究相变过程、晶体的缺陷和应力状态等均有重要意义。本实验除对晶体硅的点阵常数进行了精确测定外，仪器的系统误差对测定精度的影响也进行了测量、分析，并对测量结果给予了修正。
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| 关 键 词： | 点阵常数，精确测定，误差 |
The Precise Measurement of the Silicon''''s Lattice Constant and the Disposal of Systematical Error |
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| Zhao Baoming, Lang Shaopeng. The Precise Measurement of the Silicon''''s Lattice Constant and the Disposal of Systematical Error[J]. Journal of Anshan University of Science and Technology, 1996, 0(5) |
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| Authors: | Zhao Baoming Lang Shaopeng |
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| Affiliation: | Division of Basie Courses |
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| Abstract: | he precise measurement of the silicon's lattice constant is one of the improtant methods by which we study the crystal materials. It has great significance for the study of the phase change crystal defect stress condition. etc. The thesis accurately measure the crystal silicon's lattice constant. The author also measure and analyse the effect of the instrument's systematical error in the course of measurement and revise the result of the measurement as well. |
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| Keywords: | lattice constant precise meajurement error |
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