| XAFS在稀浓度体系和超细非晶态合金研究中的应用 |
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| 引用本文： | 韦世强,张新夷,刘文汉.XAFS在稀浓度体系和超细非晶态合金研究中的应用[J].中国科学技术大学学报,2001,31(3):276-281. |
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| 作者姓名： | 韦世强 张新夷 刘文汉 |
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| 作者单位： | 中国科学技术大学国家同步辐射实验室，合肥 230029 |
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| 基金项目： | “100 people plan” of
Chinese Academy of Sciences and National Natural Science Foundation of China (29673068) |
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| 摘 要： | 详细地阐述了荧光和透射XAFS实验方法在凝聚态物质局域结构研究中的应用，利用掠入射表面敏感荧光XAFS，常规入射荧光XAFS，原位透射XAFS分别研究（Ge4/Si4)5超晶格的结构，Si晶体中Ga,Ge,As的结构，超细非晶态Ni70B30合金退火晶化过程的局域结构及变化。
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| 关 键 词： | X射线吸收精细结构 非晶态体系 稀浓度体系 超细非晶态合金 |
| 文章编号： | 0253-2778(2001)03-0276-06 |
| 修稿时间： | 2000年11月2日 |
Dilute Systems and
Amorphous Alloys Studied by XAFS |
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| WEI Shi qiang,ZHANG Xin yi,LIU Wen han.Dilute Systems and
Amorphous Alloys Studied by XAFS[J].Journal of University of Science and Technology of China,2001,31(3):276-281. |
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| Authors: | WEI Shi qiang ZHANG Xin yi LIU Wen han |
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| Abstract: | Fluorescence and transmission XAFS measurements by high brilliance synchrotron radiation were described in detail. In order to show their powerful capacities on the structural studies of condensed matters, the surface sensitive fluorescence XAFS with a grazing incidence, fluorescence XAFS with a normal incidence and in situ transmission XAFS were used to characterize the local structures of the (Ge 4Si 4) 5 monolayer strained layer superlattice, Ga(Ge,As)/Si(001) dilute impurities and evolutions of ultrafine amorphous NiB alloys during the annealed crystallization process, respectively. |
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| Keywords: | fluorescence and transmission XAFS diluted system amorphous alloy |
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