基于AVO效应的薄层预测方法研究

通过地震波波峰和波谷间的距离预测薄层厚度，其垂直分辨率是1/8波长。本文为利用地震资料对更薄地层厚度进行预测，设计反射系数相同和相反的两种楔形模型。同时设计多个厚度不同的CDP道集，利用地层反射系数随炮检距的变化而变化的特点在CDP道集上分辨薄层。通过S变换时频分析方法提取CDP道集的单频剖面，扫描单频剖面的极值点，利用极值点间的垂直距离来预测薄层厚度。通过模型试验表明这种算法对1/16波长厚度的薄层预测效果依然准确，说明这种方法是有效的。

Research on The Thin-layer prediction Method Based on the AVO Effect

The prediction of thin layer thickness vertical resolution is 1 / 8 wavelength by the distance between seismic wave peaks and troughs. For the use of seismic data to predict the thickness of the layer of thinner, design two wedge-shaped model that the reflection coefficient are same and opposite. While design several different CDP gathers that have different layer thicknesses, use the characteristic that the reflection coefficient change with offset distinguish thin layer. Through the S-transform time-frequency analysis method to extract the single-frequency CDP gathers, scanning the extreme points of the single-frequency profile, using the vertical distance between the extreme points to predict the thickness of thin layer. By model tests showed that this method is still acurate even the thin layer thickness is 1/16 wavelength, so this method is effective.