XLPE电缆接头典型缺陷老化寿命评估研究 |
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引用本文: | 王春逢,孙长海,李锻,杭慧芳,陈晨,宋文卓,郭夫然. XLPE电缆接头典型缺陷老化寿命评估研究[J]. 科学技术与工程, 2020, 20(25): 10287-10292 |
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作者姓名: | 王春逢 孙长海 李锻 杭慧芳 陈晨 宋文卓 郭夫然 |
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作者单位: | 大连理工大学电气工程学院,大连116024;国网河南省电力公司经济技术研究院,郑州450000 |
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摘 要: | 为评估具有典型接头缺陷的交联聚乙烯(XLPE)电缆的老化寿命,对10kV电缆制作了三种常见典型电缆接头缺陷模型,分别为划痕缺陷、气隙缺陷和爬电缺陷。首先采用常规法,基于老化过程中XLPE断裂伸长率的变化,结合Arrhenius方程推算出电缆特定条件下的老化寿命,然后将逐级耐压实验数据与该寿命结果比对,得到选用电缆的寿命指数,最后采用工程经验公式计算得到具有接头缺陷电缆的老化寿命,在电压10kV,温度85℃下三种缺陷类型的老化寿命依次为18.1年、23.2年和25.1年,同时对不同缺陷类型电缆产生的差异性实验结果进行了分析。
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关 键 词: | 交联聚乙烯(XLPE)电缆 典型缺陷 Arrhenius方程 寿命指数 |
收稿时间: | 2019-12-10 |
修稿时间: | 2020-06-27 |
Assessment Study of Aging Life for Typical Defects in XLPE Cable Joints |
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Affiliation: | College of Electrical Engineering,Dalian University of Technology |
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Abstract: | To evaluate the aging life of cross-linked polyethylene (XLPE) cables with typical joint defects, three typical cable joint defect models were made for 10kV cables, namely scratch defects, air gap defects, and creeping defect. Firstly, using the conventional method, based on the change of XLPE elongation at break in the aging process, combined with the Arrhenius equation, the aging life under the specific conditions of the cable is derived, and then the experimental data of the step-by-step pressure is compared with the life result to obtain the life of the selected cable. The index is finally calculated by engineering empirical formula to calculate the aging life of the cable with joint defects. At voltage 10kV and temperature 85°C, the aging life of the three defect types is 18.1a, 23.2a and 25.1a, and the cable is produced for different defect types. The differential experimental results were analyzed. |
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Keywords: | cross-linked polyethylene (XLPE) cable typical defect Arrhenius equation life index |
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