| Abstract: | 1 Results Scanning tunneling microscope and atomic force microscope have been applied to manipulate individual atoms or clusters on a clean surface.Focused ion beam technique is routinely used to cut materials down to sub-100 nm dimension.However,in between the atomic and the sub-100 nm scales,i.e.,at the nanometer scale,to date there is no well-established physical modification technique.Here we demonstrate that localized,impurity-free nano-welding and nano-cutting techniques with a high-intensity elec... |
