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A novel method for the measurement of frequency-character of surface resistance of HTS thin film |
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| Authors: | Cheng Zeng ZhengXiang Luo ShiRong Bu Kai Yang QiShao Zhang |
| Institution: | 1 State Key Laboratory of Electronic Thin Films and Integrated Devices of University of Electronic Science and Technology, Chengdu 610054, China; 2 School of Optoelectronic Information of University of Electronic Science and Technology, Chengdu 610054, China |
| Abstract: | A novel method for microwave surface resistance measurement of high temperature superconductor thin film at multi-frequency by multimode of sapphire rod is introduced. This method has the advantages of high sensitivity and large dynamic range of the measurement. By using this method, the frequency dependent microwave surface resistance of a single piece of high temperature superconductor thin film can be characterized within one temperature cycle. This method is capable of reducing the amount of work in sur... |
| Keywords: | high temperature superconductor thin film microwave surface resistance multimode measurement frequency-character |
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