Inversion of thicknesses of multi-layered structures from eddy current testing measurements |
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Authors: | Huang Ping-jie Wu Zhao-tong |
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Institution: | Institute of Advanced Manufacturing Engineering,Zhejiang University, Hangzhou 310027, China. vamadis@yahoo.com.cn |
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Abstract: | Luquire et al.'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented. |
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