| YBa_2Cu_3O_x超导体的临界电流与显微结构 |
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| 引用本文： | 王会生. YBa_2Cu_3O_x超导体的临界电流与显微结构[J]. 北京理工大学学报, 1990, 0(Z3) |
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| 作者姓名： | 王会生 |
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| 作者单位： | 北京理工大学材料中心 |
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| 摘 要： | 用X光结构分析,电子显微镜(SEM)和高分辨率透射电镜(TEM)观察及电、磁测量等手段,系统地研究了烧结YBa_2Cu_3O_x超导体的制备工艺、显微结构与临界电流密度之间的关系,通过讨论分析,提出了主要影响临界电流密度J_c的3种界面缺陷
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| 关 键 词： | 超导体 临界电流 显微结构 晶粒间界 |
Microstructure and Critical Current of YBa_2Cu_3O_x Superconductors |
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| Wang Huisheng. Microstructure and Critical Current of YBa_2Cu_3O_x Superconductors[J]. Journal of Beijing Institute of Technology(Natural Science Edition), 1990, 0(Z3) |
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| Authors: | Wang Huisheng |
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| Affiliation: | Materials Research Center |
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| Abstract: | The relationships among the conditions of preparation , the microstructure and the critical current density of sintered YBa:Cu3Ox superconductors were studied by X - ray diffraction , SEM , TEM and electrical as well as magnetic means of experimentation . Three kinds of grain boundaries are considered responsible for the detected low Jc in sintered samples . |
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| Keywords: | superconductor critical current microstructure grain boundary |
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