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微弱信号的双锁相检测电路研究
引用本文:任小玲,许世军.微弱信号的双锁相检测电路研究[J].西安工程科技学院学报,2002,16(4):322-325.
作者姓名:任小玲  许世军
作者单位:[1]西安工程科技学院信息控制系,陕西西安710048 [2]西安工业学院数理系,陕西西安710032
基金项目:兵器工业部科研基金资助项目 ( 2 2 96 82 -3)
摘    要:在薄膜厚度监控系统的光电检测中,针对信号特征,提出了微弱信号的双锁相检测思想,并研制了一套多级放大器和双锁相放大器。其输出信噪比≥500,静态漂移率≤7%h。膜厚监控测试实验肯定了该思想和电路设计。

关 键 词:检测电路  锁相放大器  信噪比  漂移率  光电检测器
文章编号:1671-850X(2002)04-0322-04
修稿时间:2002年9月17日

Investigation on dual-lock-phase detection circuit to faint signal
REN Xiao-ling ,XU Shi-jun.Investigation on dual-lock-phase detection circuit to faint signal[J].Journal of Xi an University of Engineering Science and Technology,2002,16(4):322-325.
Authors:REN Xiao-ling  XU Shi-jun
Institution:REN Xiao-ling 1,XU Shi-jun 2
Abstract:In the optoelectronic detection of thin-film thickness monitoring control system, based on the characteristics of quar-optical path, an idea of dual-lock-phase detection to faint signal is proposed, the multi-stage amplifier and the dual-lock-phase amplifier are developed. The signal-to-noise ratios of two output signals are equal to or more than 500, the static drift ratios are equal to or less than 7%/h. The experiments of monitoring thin-film thickness show that the idea and the design are reasonable.
Keywords:quar-optical path  lock-phase amplifier  signal-to-noise ratio  drift ratio
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