Ti4+的掺入对Y2O2S:Eu3+,Mg2+,Ti4+陷阱分布和余辉性能的影响

用高温固相法制备了不同Ti4+掺杂量的红色长余辉材料Y2O2S:Eu3+,Mg2+,Ti4+,其X射线衍射分析、发射光谱和激发光谱均不受Ti4+掺杂量改变的影响.测量了Ti4+掺杂量不同的样品的热释光谱,随着Ti4+掺杂量的增加,热释光的峰值强度先增强后减弱,有了很大的变化;用PeakFit软件以一般阶动力学模型对Ti与Y2O2S的物质的量比分别为0.5%,2.5%和8.0%的样品进行了热释光曲线拟合,得出了它的单峰曲线并计算了与其对应的陷阱参数.陷阱分布表明:当Ti掺杂量为2.5%时,有利于合适深度陷阱的大量形成,从而使材料的发光和余辉性能得到了很大的提高.

Effect of Ti Doped Concentration on Distribution of Traps and Characteristic of Afterglow for Y2O2S: Eui3 + , Mg2 + , Ti4+

Red long-afterglow Y_2O_2S:Eu(3+),Mg(2+),Ti(4+)phosphors of different concentrations Ti were synthesized by conventional solid phase reaction method. X-ray power diffraction of the samples did not changed with the increase of Ti concentrations. With increase of the Ti doped concentration, the emission spectra and excitation spectra of the samples did not altered, either. But the thermoluminescence intensity was effected greatly by increasing of Ti concentrations. The trapped depths were acquired by fitting the experimental results with general order kinetic model.The results suggested that the sample containing Ti in 2.5%,which was compared with the sample containing Ti in 0.5% and 0.8%,possessed many traps with befitting depths. The afterglow properties caused by the distribution of the trapped depths can be advanced greatly.