| 组合电路的随机检测长度分析 |
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| 引用本文： | 王辉军,马冀民.组合电路的随机检测长度分析[J].北京化工大学学报(自然科学版),1991(4). |
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| 作者姓名： | 王辉军 马冀民 |
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| 作者单位： | 北京化工学院计算机系
(王辉军)，北京化工学院计算机系(马冀民) |
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| 摘 要： | 超大规模集成电路及所伴随问题的出现,在数据产生和检测方式有效性的分析方面再次引发了对随机检测的兴趣,即网络的输入采用随机方式,在实际应用中可采用线性反馈移位寄存器(LFSR)来产生输入向量。作者分析了在组合逻辑中测试长度与随机检测之间的关系,并讨论了用随机法测试延迟路径的能力。
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| 关 键 词： | 随机测试 路径延迟 组合逻辑 测试长度 |
Analysis of Random Testing Length for Combination Circuit |
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| Wang Huijun Ma Jimin.Analysis of Random Testing Length for Combination Circuit[J].Journal of Beijing University of Chemical Technology,1991(4). |
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| Authors: | Wang Huijun Ma Jimin |
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| Institution: | Department of Computer |
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| Abstract: | The advent of the extra-large scale integration and its concomitant problem, random testing was concerned again in the field of data generation and analysis of effectiveness no testing pattern. The network input assumed to be random pattern, while in practice, Linear Feedback Shift Registers (LFSR) were used to generate input vectors. In this paper, the relation between the testing length in combinatorial logic and the random testing is analyzed, and the capability of path delay by using random testing is discussed. |
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| Keywords: | random testing path delay combinatorial logic testing length |
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