微带和鳍线导体损耗的全波分析

在微带和鳍线的直线法分析理论的基础上，提出了一种计算由金属屏蔽和导体条带表面阻抗引起的导体损耗的方法。导出了计算公式。比较了用本方法算得的和实际测得的微带导体损耗，还比较了用本方法和谱域法算得的鳍线导体损耗。结果的良好一致性证明了这一方法的有效性。

Full-Wave Analysis of Conductor Losses of Microstrips and Fin Lines

Based on the theory of analysis of microstrips and fin lines by the line method, an approach of computing the conductor losses which rise from the skin inipedance of metal shieldinss and conductor stripe is proposed. A set of formulas fur computing are derived. The computation results of the conductor losses of microstrips are comipared with the experimental data and those of fin lines are compared with the ones obtained by spectral domain approach. The good coincidences verify the validity of the approach proposed.