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用于X光机参数检测的C8051F单片机功能开发
引用本文:杨美仙.用于X光机参数检测的C8051F单片机功能开发[J].山西科技,2009(3):31-33.
作者姓名:杨美仙
作者单位:山西大同大学工学院,山西大同,037003
摘    要:单片机具有全电脑功能,且有体积小、可靠性高、售价低的特点。虽然它属于高技术产品,却简单易学,开发应用方便。近年来,随着计算机在社会各个领域的渗透,单片机的应用正在不断地走向深入,同时带动传统控制检测日新月异。在实时检测和自动控制的单片机应用系统中,单片机往往是作为一个核心部件来使用。单片机的功能是靠程序来实现的,并且可以修改。通过不同的程序实现不同的功能,尤其是一些特殊的功能。文章介绍一种用于X光机参数检测的C8051F单片机的功能开发。

关 键 词:单片机  功能开发  参数检测

Functional Development of C8051F SCM Used in the Parameter Testing of X-ray Units
Yang Meixian.Functional Development of C8051F SCM Used in the Parameter Testing of X-ray Units[J].Shanxi Science and Technology,2009(3):31-33.
Authors:Yang Meixian
Institution:Yang Meixian
Abstract:The SCM has the function of computers with the features of small size, higher reliability and low cost. It is a high-tech product, but easy to learn and develop. In recent years, with the application of computers in all fields of the society, the application of SCMs is widening, causing great changes to the traditional control testing. In the system of real-time testing and automatic control, SCMs are usually used as a core component, and their functions are realized through programs and can be modified. The paper introduces the function development a C8051F SCM used in the parameter testing of X-ray units.
Keywords:SCM  functional developmen  parameter testing
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