| CMOS 存储器中地址译码器的开路故障及测试 |
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| 引用本文： | 刘建都,张安堂.CMOS 存储器中地址译码器的开路故障及测试[J].空军工程大学学报,2000,1(2):78-81. |
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| 作者姓名： | 刘建都 张安堂 |
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| 作者单位： | 空军工程大学导弹学院!陕西三原713800 |
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| 摘 要： | 对 CMOS存储器中地址译码器的开路故障进行了分析和分类 ,得出了其中有一类开路故障不能用常用的测试算法可靠的测试出 ,给出了测试该类开路故障的测试方法以及针对该类开路故障的容错性设计方案
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| 关 键 词： | CMOS存贮器 地址译码器 开路故障 推进测试算法 |
Open Defects and Testing in CMOS RAM Address Decoders |
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| LIU Jian-du,ZHANG An-tang.Open Defects and Testing in CMOS RAM Address Decoders[J].Journal of Air Force Engineering University(Natural Science Edition),2000,1(2):78-81. |
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| Authors: | LIU Jian-du ZHANG An-tang |
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| Institution: | The Missile Instltute ,AFEU. ,Sanyuan 713800 , China |
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| Abstract: | At first,this paper analyces the open defect of CMOS RAM address decoder,it comes out that one type open defect cannot be detected by march test algorithm,and then we give the test method of this type undetectable fault and the design scheme with built in tolerance against hard to detect open defects. |
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| Keywords: | CMOS RAM address decoder open defect march test |
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