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位错密度的定量测定
引用本文:李长生,郭振中,江自应. 位错密度的定量测定[J]. 辽宁工程技术大学学报(自然科学版), 1989, 0(4)
作者姓名:李长生  郭振中  江自应
作者单位:阜新矿业学院热处理教研室(李长生),东北工学院(郭振中),东北工学院(江自应)
摘    要:本文在EM-400T透射电子显微镜上测定了不同含量稀土铝试样的膜厚.同时考虑到难于选择适当的操作矢量g_(hkl),使所有位错参与成象.因此,拍摄了一条系列照片,每张照片用一个强反射.尽量减少不可见位错的影响,按割线法计算出不同试样的位错密度.

关 键 词:汇聚束衍射  诱射电子显微镜  操作矢量  位错

THE QUANTITATNE DETERMINATION OF DISLOCATION DENSITY
Li Changsheng Guo Zhenzhong Jiang Ziying. THE QUANTITATNE DETERMINATION OF DISLOCATION DENSITY[J]. Journal of Liaoning Technical University (Natural Science Edition), 1989, 0(4)
Authors:Li Changsheng Guo Zhenzhong Jiang Ziying
Affiliation:Li Changsheng Guo Zhenzhong Jiang Ziying
Abstract:The measurement of foil thichness with converging beam diffraction has the following abvantage:the measurement thickness is the one in the direction of electronic beam and the measurment of foil thickness is critical to the calculation of dislocation density using EM-400T transmission electron microscope. The thickness measurement of rare earth aluminium samples of different contents is studied in this paper.In the meantime considering the difficulty in choosing proper worker vectors to make all the dislocations take part in image formation,we have taken a number of photographs, all of which are of strong reflection. The influence of invisible dislocations being lessened as far as possible the dislocation densities of different samples are worked out with the secant methed.
Keywords:converging beam diffraction  transmission electron microscope  worker vector dislocation
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