| 芯片测试环节质量重入随机系统建模与性能分析 |
| |
| 引用本文： | 李娜,江志斌,郑力,李杰.芯片测试环节质量重入随机系统建模与性能分析[J].系统工程理论与实践,2011,31(8):1593-1599. |
| |
| 作者姓名： | 李娜 江志斌 郑力 李杰 |
| |
| 作者单位： | 1. 上海交通大学 工业工程系,上海 200240;
2. 清华大学 工业工程系,北京 100084;
3. 唐山长城钢铁集团 九江线材有限公司,唐山 064400 |
| |
| 基金项目： | 国家自然科学基金(71002037); 教育部博士点基金(20100073120080) |
| |
| 摘 要： | 芯片测试系统中,由于检测设备的不稳定性、产品价值昂贵等原因,产品检测过程中出现质量问 题后经过一定调整重新进入检测,会形成质量重入问题.该类质量问题与系统的随机特性结合,使得系统 的产出,周期等与系统参数呈现出复杂的非线性关系特性.本研究结合某芯片测试企业的实际问 题,采用马尔科夫方法构建了模型,并获得系统的性能指标与参数之间的数值量化关系.阐述 了方法的应用过程,进行了系统的性能评估和改善,为实际系统提出了质量管理、缓存设计、周期控制 的相关建议.
|
| 关 键 词： | 芯片测试 质量重入性 随机系统 |
| 收稿时间： | 2009-12-28 |
Modelling and analysis of semiconductor test system with quality re-entrance and stochastic characteristic |
| |
| LI Na,JIANG Zhi-bin,ZHENG Li,LI Jie.Modelling and analysis of semiconductor test system with quality re-entrance and stochastic characteristic[J].Systems Engineering —Theory & Practice,2011,31(8):1593-1599. |
| |
| Authors: | LI Na JIANG Zhi-bin ZHENG Li LI Jie |
| |
| Institution: | 1. Department of Industrial Engineering, Shanghai Jiaotong University, Shanghai 200240, China;
2. Department of Industrial Engineering, Tsinghua University, Beijing 100084, China;
3. Jiujiang Wire Co. Ltd, Tangshan 064400, China |
| |
| Abstract: | In semiconductor test system,chips are inspected at the tester station.Because of the unsteady of the machines and some other technical issues with respect to products,the inspection results are not so reliable that the chips with quality issues will be treated and re-enter the testers.This phenomenon is defined as quality re-entrance which will influence the throughput and cycle time of the system dramatically. Besides that,the inspection times of the system are not constant but with some stochastic proper... |
| |
| Keywords: | semiconductor test quality re-entrance stochastic |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
| 点击此处可从《系统工程理论与实践》浏览原始摘要信息 |
| 点击此处可从《系统工程理论与实践》下载免费的PDF全文 |
|
