| 316L和316LN不锈钢在高温高盐溶液中钝化膜的性能研究 |
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| 引用本文： | 王育武,姜瑞景,赵景茂.316L和316LN不锈钢在高温高盐溶液中钝化膜的性能研究[J].北京化工大学学报(自然科学版),2017,44(5):72-79. |
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| 作者姓名： | 王育武 姜瑞景 赵景茂 |
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| 作者单位： | 北京化工大学材料科学与工程学院,北京,100029;北京化工大学材料科学与工程学院,北京 100029;北京化工大学材料科学与工程学院材料电化学过程与技术北京市重点实验室,北京 100029 |
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| 摘 要： | 利用电化学及扫描电子显微镜（SEM）对316L与316LN两种不锈钢在高温高盐环境中的耐蚀性能进行了对比研究，利用Mott-Schottky曲线研究了两种材料的钝化膜半导体特征，借助X射线光电子能谱（XPS）研究了316LN不锈钢的钝化膜结构以及N元素在钝化膜中的分布状态。结果表明：在高温高盐环境中，两种材料形成的钝化膜都为n型半导体；316LN不锈钢形成的钝化膜耐点蚀性能更好，其钝化膜内缺陷浓度更低，N元素会在钝化膜中富集。最后利用点缺陷原理对316LN钝化膜的耐蚀机理进行了研究。
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| 关 键 词： | 高温高盐 不锈钢 钝化膜 电化学 X射线光电子能谱(XPS) |
| 收稿时间： | 2017-03-31 |
The properties of passive films formed on 316L and 316LN stainless steel in high-temperature and high-salinity solution |
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| WANG YuWu,JIANG RuiJing,ZHAO JingMao.The properties of passive films formed on 316L and 316LN stainless steel in high-temperature and high-salinity solution[J].Journal of Beijing University of Chemical Technology,2017,44(5):72-79. |
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| Authors: | WANG YuWu JIANG RuiJing ZHAO JingMao |
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| Institution: | 1. College of Materials Science and Engineering, Beijing University of Chemical Technology, Beijing 100029, China;2. Beijing Key Laboratory of Electrochemical Process and Technology for Material, College of Materials Science and Engineering, Beijing University of Chemical Technology, Beijing 100029, China |
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| Abstract: | The passive films formed on 316L and 316LN stainless steel in high-temperature and high-salinity solution have been investigated by electrochemical measurements and surface analysis methods.The results show that the passive films formed on both 316L and 316LN stainless steel behave as n-type semiconductors,but the passive film formed on 316LN stainless steel has lower donor density and better anti-pitting properties.X-ray photoelectron spectroscopy (XPS) show N enrichment in the passive films,and the anti-pitting mechanism of the 316LN stainless steel passive film is discussed using a point defect model. |
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| Keywords: | high-temperature and high-salinity stainless steel passive film electrochemical X-ray photoelectron spectroscopy (XPS) |
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