| 6800微处理机在表面逸出功分布测量中的应用 |
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| 引用本文： | 钱迈期,陈德森.6800微处理机在表面逸出功分布测量中的应用[J].东南大学学报(自然科学版),1987(4). |
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| 作者姓名： | 钱迈期 陈德森 |
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| 作者单位： | 南京化工学院硅工系，南京工学院电子工程系 |
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| 摘 要： | 测定样品(如阴极等)表面的逸出功的平面分布和数值分布,为表面研究提供了重要而丰富的信息。对于阴极研究,这是一个重要的研究课题。在工业摄像管光靶的位置上换放待研究的阴极样品,利用原电子枪产生的扫描电子束作为探测逸出功的探针,就构成低能电子扫描探针的测试系统。电子枪发射出固定的束流i_0。如果样品表面对枪阴极的接触电势差(V_d=(φ_c—φ_a)/e)是拒斥势的话,则束流中具有初始动
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Application of 6800 Microprocessor to Measuring the numerical Distribution of Work Function of Sample |
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| Qian Maiqi.Application of 6800 Microprocessor to Measuring the numerical Distribution of Work Function of Sample[J].Journal of Southeast University(Natural Science Edition),1987(4). |
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| Authors: | Qian Maiqi |
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| Institution: | Qian Maiqi(Department of Silicate Engineering Nanjing Institute of Chemical Technology) Chen Desheng(Department of Electronic Engineering Nanjing Institute of Technology) |
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| Abstract: | With interface circuit, applying 6800 microprocessor to SLEEP (Scanning Low Energy, Electron Probe), a new instrument has been made which is used to measure the numerical distribution of the surface work function of a sample. It takes only 8 seconds to complete all the measurements when the surface of the sample is divided into more than 30,000 sampling points. Afterwards, under the control of the microprocessor, the distribution curve can be drawn by a function plotter. And the planar distribution of the work function of the sample can be displayed in a general oscillator, as well. |
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| Keywords: | work function energy analyser sampling |
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