| 半导体量子点光谱特性标准样品及高分辨透射电子显微镜粒径定值研究 |
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| 引用本文： | 刘忍肖,张丽娜,李学毅,齐笑迎,吴侠,汤艳,魏文博,葛广路. 半导体量子点光谱特性标准样品及高分辨透射电子显微镜粒径定值研究[J]. 中国科学:物理学 力学 天文学, 2011, 0(9): 1023-1028 |
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| 作者姓名： | 刘忍肖 张丽娜 李学毅 齐笑迎 吴侠 汤艳 魏文博 葛广路 |
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| 作者单位： | 国家纳米科学中心纳米标准研究室中国科学院纳米标准与检测重点实验室;清华大学物理系清华-富士康纳米科技研究中心;国家纳米科学中心纳米检测实验室;国家纳米科学中心纳米制造与应用基础研究室; |
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| 基金项目： | 国家重大科学研究计划资助项目(编号:2006CB932605,2011CB932803) |
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| 摘 要： | 半导体量子点纳米晶体是一类典型的纳米材料,具有独特的光学特性,已在生物医学、光电转换等领域得到应用.量子点纳米晶体的标准样品对其质量控制和产业应用都有重要的意义,但需要对其光学特性和尺寸特性进行准确测量研究.我们研制了以硒化镉量子点为代表的半导体量子点纳米晶体标准样品,并对其光学特性进行定值.针对目前制约量子点粒子尺寸准确测量的透射电子显微镜样品基底问题进行改进,用碳管-氧化石墨烯微栅代替常用的超薄碳膜微栅.通过高分辨透射电子显微镜表征得到晶格清晰的小尺寸半导体量子点纳米晶体的形貌像.这些结果有助于建立硒化镉量子点半导体纳米晶体的特征带边吸收峰值与粒子粒径的准确定量对应关系,从而推动量子点的应用.
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| 关 键 词： | 半导体量子点 标准样品 特征带边吸收峰 粒径 |
Towards spectroscopic reference material of semiconductor quantum dots and the size characterization using HRTEM |
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| LIU RenXiao,ZHANG LiNa,LI XueYi,QI XiaoYing,WU Xia,TANG Yan,WEI WenBo , GE GuangLu Laboratory for Nanost,ardization,National Center for Nanoscience , Technology,The Key Laboratory for Nanost,ardization , Nanocharacterization,Chinese Academy of Science,Beijing ,China. Towards spectroscopic reference material of semiconductor quantum dots and the size characterization using HRTEM[J]. SCIENCE CHINA Physics, Mechanics & Astronomy, 2011, 0(9): 1023-1028 |
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| Authors: | LIU RenXiao ZHANG LiNa LI XueYi QI XiaoYing WU Xia TANG Yan WEI WenBo & GE GuangLu Laboratory for Nanost ardization National Center for Nanoscience Technology The Key Laboratory for Nanost ardization Nanocharacterization Chinese Academy of Science Beijing China |
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| Affiliation: | LIU RenXiao1,ZHANG LiNa2,LI XueYi1,QI XiaoYing3,WU Xia4,TANG Yan1,WEI WenBo1 & GE GuangLu1* 1 Laboratory for Nanostandardization,National Center for Nanoscience and Technology,The Key Laboratory for Nanostandardization and Nanocharacterization,Chinese Academy of Science,Beijing 100190,China,2 Department of Physics and Tsinghua-Foxconn Nanotechnology Research Center,TsinghuaUniversity,Beijing 100084,3 The Testing Laboratory for Nanostructures,Beijing 10019... |
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| Abstract: | Semiconductor nanocrystals(quantum dots) are a typical family of nanomaterials possessing unique optical pro-perties,and have wide applications in biomedicine and optoelectronics.Reference materials for quantum dots will be important for quality control and industry applications,but require precise measurement research on the optical and geometrical characteristics.We describe here the initial effort towards developing RMs for CdSe quantum dots by charactering the optical properties.We also modify the TEM s... |
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| Keywords: | semiconductor quantum dots reference material band-edge absorption peak particle size |
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