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Nb5N6 thin film on silicon and silicon oxide: A good material for terahertz detection
Authors:XueHui Lu   Ning He   Lin Kang   Jian Chen   BiaoBing Jin  PeiHeng Wu
Affiliation:Department of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China
Abstract:Voltage responsivity of bolometer will benefit from high temperature coefficient of resistance (TCR) of the material. The Nb5N6 thin solid films we proposed in this paper have high TCR, compared with the commonly-used materials such as Nb and Bi. The films were sputtered on Si(100), SiO2/Si(100), SiO2 substrates by using radio frequency (r f) magnetron sputtering. The deposition conditions have been optimized to get high TCR. The highest TCR is over 0.91% K−1 at 300 K and up to 4.5% K−1–7% K−1 at 78 K, which is good enough to be used in terahertz detection and thermometer fabrication in the range from 78 K to 300 K.
Keywords:Nb5N6 thin solid films   temperature coefficient of resistance (TCR)   terahertz detection   thermometer
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