| 非易失性芯片数据安全存取探讨 |
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| 引用本文： | 王玉. 非易失性芯片数据安全存取探讨[J]. 科技情报开发与经济, 2008, 18(28): 146-147 |
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| 作者姓名： | 王玉 |
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| 作者单位： | 山西省科技交流中心,山西太原,030001 |
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| 摘 要： | 就如何保证非易失性芯片数据存储的安全问题提出了解决方法,即光耦隔离、延长单片机的复位过程、掉电判断,并以24C16和89C51为例给出了具体电路及其工作原理。
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| 关 键 词： | 非易失性芯片 数据存取 24C16 89C51 |
Probe into the Secure Access of the Data on the Nonvolatile Chip |
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| WANG Yu. Probe into the Secure Access of the Data on the Nonvolatile Chip[J]. Sci-Tech Information Development & Economy, 2008, 18(28): 146-147 |
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| Authors: | WANG Yu |
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| Abstract: | This paper puts forward the methods for solving the secure access of the data on the nonvolatile chip that are the optocoupler isolation, the extension of reset procedure of microcontroller and the determination of the power failure, and presents the concrete circuit and its working principles taking 24C16 and 89C51 as the examples. |
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| Keywords: | 24C16:89C51 |
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