| 多元组份薄膜的特征X射线强度的蒙特卡罗模拟计算方法 |
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| 引用本文： | 胡幼华,潘荫荣,朱惠彪. 多元组份薄膜的特征X射线强度的蒙特卡罗模拟计算方法[J]. 华东师范大学学报(自然科学版), 2000, 0(3): 50-55 |
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| 作者姓名： | 胡幼华 潘荫荣 朱惠彪 |
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| 作者单位： | 华东师范大学计算机科学系,上海,200062 |
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| 摘 要： | 作者提出了入射电子在多元组份薄膜中所激发出的薄膜中各种元素的包括初次Ｘ射线和二次荧光在内的特征Ｘ射线强度的蒙特卡罗模拟计算方法。用这一方法模拟计算了多个薄膜样吕的特征Ｘ射线强度比，得到了与电子探针显微分析仪器测定的实验数据相一致的模拟结果。
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| 关 键 词： | 蒙特卡罗模拟 多元组份薄膜 特征X射线强度 |
| 修稿时间： | 1999-05-01 |
A Monte Carlo Simulation Method for Calculating Characteristic X-ray Intensities of A Multicomponent Film |
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| HU You-hua,PAN Yin-roug,ZHU Hui-biao. A Monte Carlo Simulation Method for Calculating Characteristic X-ray Intensities of A Multicomponent Film[J]. Journal of East China Normal University(Natural Science), 2000, 0(3): 50-55 |
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| Authors: | HU You-hua PAN Yin-roug ZHU Hui-biao |
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| Abstract: | In this paper, a Monte Carlo simulation method for calculating intensities of characteristic x-rays, including primary x-rays and secondary fluorescences, of elements in a multicomponent film excited by incident electrons is presented. Simulation results for several examples in agreement with experimental data measured by electron probe microanalysis instruments are obtained. |
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| Keywords: | Monte Carlo simulation quantitative electron probe microanalysis multicomponent film characteristic x-ray intensity |
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