| 静态测量法在分析电镜高压系统故障中的应用 |
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| 引用本文： | 李子荣,罗兴光,李平均,朱淑媛.静态测量法在分析电镜高压系统故障中的应用[J].湖南工程学院学报(自然科学版),2003,13(1):21-23. |
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| 作者姓名： | 李子荣 罗兴光 李平均 朱淑媛 |
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| 作者单位： | 南华大学基础医学院,湖南,衡阳,421001 |
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| 摘 要： | 电子显微镜高压电子枪系统结构复杂，价格昂贵；故障分析判断难度大，维修风险高．高压电子枪系统高压电缆开路故障主要表现为束流表无指示，主机无法正常工作．通过对S—570扫描电子显微镜高压电子枪系统高压电缆开路故障的分析，介绍运用静态测量法分析电子显微镜高压系统故障的一般方法和步骤．
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| 关 键 词： | 电子显微镜 高压电子枪系统 故障分析 静态测量法 高压电缆开路故障 |
| 文章编号： | 1671-119X(2003)01-0021-03 |
| 修稿时间： | 2002年12月9日 |
Aapplication of Static Measurement in Analyzing Aailure of High-voltage Electron Gun System in Electron Microscope |
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| LI Zi-rong,LUO Xing-guang,LI Ping-jun,ZHU Shu-yuan.Aapplication of Static Measurement in Analyzing Aailure of High-voltage Electron Gun System in Electron Microscope[J].Journal of Hunan Institute of Engineering(Natural Science Edition),2003,13(1):21-23. |
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| Authors: | LI Zi-rong LUO Xing-guang LI Ping-jun ZHU Shu-yuan |
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| Abstract: | The high-voltage electron gun system in electron microscope is structurally complex and high costly.Analysis and judgment on its failure are very difficult,and the repairing is highly risky.The main symptoms of open-circuit failure of the high-voltage electron gun system are that there is no indication on the electron beam ampere-meter and that the electron microscope can't work mormally.By analyzing the open-circuit failure of the high-voltage electron gun system in the S-570 electron microscope,this paper presents the general methods and procedures for the application of static measure in analyzing failure of high-voltage electron gun system. |
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| Keywords: | static measurement high-voltage system application |
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