基于脉冲注入调制的LD光功率-电流-电压特性测试系统

为精确测试半导体激光器(LD)的光功率-电流-电压(LIV)特性,提出一种基于脉冲注入调制的方法,并据此研制新型的LD脉冲测试系统.系统通过给被测LD注入脉冲宽度、周期及幅度连续可调的脉冲电流,采集恒功或恒流工作LD的工作电流、两端电压、背光电流和输出光功率等信息,绘制LD的LIV特性曲线,并以此推断LD的性能.采取低占空比的脉冲注入,有效抑制了LD有源区温度升高,保证了测试的可靠性和准确性.实验结果表明,脉冲电流的稳定度达到10-4,系统满足设计要求,其性能优于连续测试系统.

Pulse injection testing for LD chip LIV characteristics

A method based on pulse injection was put forward to test the light-current-voltage(LIV) characteristics of laser diode(LD),and a new type of pulse measurement system was developed.The system provided pulsed current with continuously adjustable pulse width,pulse cycle and pulse amplitude to the measured LD,and collected the data generated from forward current,terminal voltage,backlight current and optical power of LDs under automatic power control or automatic current control,and then the LIV characteristics curves of LD were plotted based on above data,and the performance of LD was deduced.The pulsed current with low duty ratio effectively inhibited the temperature increasing in the active region of LD,which guaranteed the accuracy and reliability of the tests.Experimental results show that the stability of forward pulse current can reach 10-4,which meet the requirements for the LIV testing system,and its performance is superior to the DC testing system.