| 数字检测电路和测试生成算法 |
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| 引用本文： | 张耀华,赵明,刘梅群.数字检测电路和测试生成算法[J].河北科技大学学报,1994(4). |
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| 作者姓名： | 张耀华 赵明 刘梅群 |
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| 作者单位： | 河北轻化工学院基础课部 |
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| 摘 要： | 提出一种将任意数字组合电路转变为检测电路的方法和检测电路的测试生成算法。对数字电路中所有引线的单固定故障都能产生测试向量，计算量的上限是２（ｍ＿１＋４ｍ＿２）￣２。
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| 关 键 词： | 线控电路 组合逻辑电路 测试生成 |
Digital Detective Circuits and Testing Generative Algorithm |
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| Zhang Yaohua, Zhao Ming, Liu Meiqun.Digital Detective Circuits and Testing Generative Algorithm[J].Journal of Hebei University of Science and Technology,1994(4). |
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| Authors: | Zhang Yaohua Zhao Ming Liu Meiqun |
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| Institution: | Department of Fundamental Courses |
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| Abstract: | The methods to convert any digital combinative circuit to a detective circuit and the testing generative algorithm of detective circuits are presented in this paper. The single sticking fault of all the lines in digital circuit can generate meagering vector. The upper bound of computation is 2 (m1 + 4m2 )2. |
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| Keywords: | line control circuit combinative logic circuit testing generation |
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