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非晶硅薄膜的制备及晶化研究
引用本文:段良飞,张力元,杨培志,化麒麟,邓双,廖华. 非晶硅薄膜的制备及晶化研究[J]. 云南师范大学学报(自然科学版), 2013, 33(2): 16-19
作者姓名:段良飞  张力元  杨培志  化麒麟  邓双  廖华
作者单位:可再生能源材料先进技术与制备教育部重点实验室,云南昆明650092;云南师范大学太阳能研究所,云南昆明650092
基金项目:国家自然科学基金联合基金资助项目
摘    要:采用磁控溅射技术首先在玻璃基片、单晶硅片上溅射非晶硅薄膜再在其表面溅射铝膜,并用快速退火炉在不同温度下进行退火。利用台阶仪、拉曼散射光谱(Raman)仪和X射线衍射(XRD)仪对薄膜进行性能表征。结果表明:在功率120W,气压1.5~2.5pa,时间为3.5~4.5h的条件下可制备得非晶硅薄膜,Al诱导能降低晶化温度,并在500~600℃间存在一最佳晶化温度。

关 键 词:非晶硅薄膜  磁控溅射  铝诱导晶化  多晶硅

Study on the Preparation and Crystallization of Amorphous Silicon Film
DUAN Liang-fei , ZHANG Li-yuan , YANG Pei-zhi , HUA Qi-lin , DENG Shuan , LIAO Hua. Study on the Preparation and Crystallization of Amorphous Silicon Film[J]. Journal of Yunnan Normal University (Natural Sciences Edition), 2013, 33(2): 16-19
Authors:DUAN Liang-fei    ZHANG Li-yuan    YANG Pei-zhi    HUA Qi-lin    DENG Shuan    LIAO Hua
Affiliation:1,2(1.Key Laboratory of Renewable Energy Advanced Materials and Manufacturing Technology of Ministry of Education of China,Kunming 650092,China; 2.Solar Energy Research Institute,Yunnan Normal University,Kunming 650092,China)
Abstract:Morphous silicon thin films and luminum thin films were deposited on glass substrate and monocrystalline silicon substrate by magnetron sputtering.The thin films were characterized by Profile-system,Raman scattering spectroscopy(Raman)and X-ray diffraction(XRD).Results show amorphous silicon thin film can be well prepared by magnetron sputtering at 120w,1.5~2.5pa Ar pressure for 3.5~4.5h.Al induction can reduce crystallization temperature.Preliminary research shows that an optimal crystallization temperature is existing in the temperature range of 500-600℃,with aluminum induction.
Keywords:Amorphous silicon thin film  Magnetron Sputtering  Aluminum-induced crystallization  Polycrystalline silicon
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