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基于适应性模拟退火的标准单元布局算法
引用本文:南国芳,李敏强,寇纪淞.基于适应性模拟退火的标准单元布局算法[J].系统仿真学报,2006,18(3):550-553,576.
作者姓名:南国芳  李敏强  寇纪淞
作者单位:天津大学系统工程研究所,天津,300072
基金项目:中国科学院资助项目;中国博士后科学基金
摘    要:提出了一种基于适应性模拟退火的标准单元布局算法,针对各布局电路的特性,在传统的模拟退火算法中引入适应性初始温度和适应性搜索区域的概念,并对标准单元布局中目标函数中的惩罚项做出相应改进。该算法用于对一组标竿电路进行测试,和传统模拟退火算法得出的结果相比,在布局效果上和时间性能上均显示出优越性。

关 键 词:超大规模集成电路  标准单元  单元布局  模拟退火
文章编号:1004-731X(2006)03-0550-04
收稿时间:2005-01-07
修稿时间:2005-01-072005-06-06

Standard Cell Placement Algorithm Based on Adaptive Simulated Annealing
NAN Guo-fang,LI Min-qiang,KOU Ji-song.Standard Cell Placement Algorithm Based on Adaptive Simulated Annealing[J].Journal of System Simulation,2006,18(3):550-553,576.
Authors:NAN Guo-fang  LI Min-qiang  KOU Ji-song
Institution:Institute of System Engineering, Tianjin University, Tianjin 300072,China
Abstract:A standard cell placement algorithm based on adaptive simulated annealing was proposed.Due to characters of all circuits to be placed, adaptively initial temperature and adaptive searching region were added to traditional simulated annealing algorithm. At the same time, punishment item in objective function was improved for standard cell placement problem. This algorithm was applied to test a set of benchmark circuits, and experiments show its advantages in placement results and time performance by comparing with traditional simulated annealing algorithm.
Keywords:VLSI  standard cell  cell placement  simulated annealing
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