| 利用原子力显微镜测量石英岩表面分子沉积膜的粘附力 |
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| 引用本文： | 王德国,高芒来,张嗣伟.利用原子力显微镜测量石英岩表面分子沉积膜的粘附力[J].中国石油大学学报(自然科学版),1999,23(4). |
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| 作者姓名： | 王德国 高芒来 张嗣伟 |
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| 作者单位： | 石油大学机电工程系,北京102200 |
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| 基金项目： | 石油大学（北京）科研基金 |
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| 摘 要： | 对原子力显微镜（ＡＦＭ）探针测出的一条理想的力位移曲线进行了分析，推导出了根据实测的力位移曲线计算粘附力的公式。对表面分子沉积膜生长前后的石英岩和扫描探针之间的粘附力进行了实验研究，结果发现这种沉积膜可以降低石英岩表面的粘附力
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| 关 键 词： | 原子力显微镜 石英岩 分子沉积膜 粘附力 测量 计算公式 |
DETERMINATION OF THE ADHESIVE FORCE OF MOLECULAR DEPOSITION FILM ON SILICA SURFACE BY ATOMIC FORCE MICROSCOPY |
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| Wang Deguo,Gao Manglai,Zhang Siwei.DETERMINATION OF THE ADHESIVE FORCE OF MOLECULAR DEPOSITION FILM ON SILICA SURFACE BY ATOMIC FORCE MICROSCOPY[J].Journal of China University of Petroleum,1999,23(4). |
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| Authors: | Wang Deguo Gao Manglai Zhang Siwei |
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| Institution: | Beijing:102200 |
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| Abstract: | perfect force\|displacement curve measured by using atomic force microscopy (AFM)
is analyzed, and a formula for calculating adhesive force according to the testing
force\|displacement curve is deduced. The adhesive force between silica sample and scanning
probe before and after growing molecular deposition films on the surface of silica was
experimentally studied. It is found that the molecular deposition can lower the adhesive force
on the surface of silica.\= |
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| Keywords: | atomic force microscopy silica molecular deposition film adhesive force measurement formula\= |
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