| 无机厚膜电致发光显示器件的研究 |
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| 引用本文： | 薛唯,周代兵,蒋玉蓉,喻志农,卢维强. 无机厚膜电致发光显示器件的研究[J]. 北京理工大学学报, 2005, 25(2): 131-133 |
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| 作者姓名： | 薛唯 周代兵 蒋玉蓉 喻志农 卢维强 |
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| 作者单位： | 北京理工大学信息科学技术学院光电工程系,北京,100081 |
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| 摘 要： | 采用丝网印刷技术,在Al2O3陶瓷基板上印刷、高温烧结内电极及绝缘层,制备出陶瓷厚膜基板,进而制备了新型厚膜电致发光显示器(TDEL).整个器件结构为陶瓷基板/内电极/厚膜绝缘层/发光层/薄膜绝缘层/ITO透明电极.测试了器件的阈值电压、亮度与电压、亮度与频率关系,并对器件衰减特性进行了分析.结果显示厚膜电致发光器件比薄膜电致发光器件有更低的阈值电压和较小的介电损耗,有效地防止了串扰现象.
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| 关 键 词： | 陶瓷厚膜 绝缘层 电致发光 厚膜基板 发光显示器件 研究 Inorganic Devices Dielectric 现象 串扰 介电损耗 薄膜电致发光器件 结果 分析 衰减特性 关系 频率 亮度 阈值电压 测试 透明电极 薄膜绝缘层 |
| 文章编号： | 1001-0645(2005)02-0131-04 |
| 收稿时间： | 2004-04-05 |
Study on Thick Dielectric Electroluminescent Devices with Inorganic |
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| XUE Wei,ZHOU Dai-bing,JIANG Yu-rong,YU Zhi-nong and LU Wei-qiang. Study on Thick Dielectric Electroluminescent Devices with Inorganic[J]. Journal of Beijing Institute of Technology(Natural Science Edition), 2005, 25(2): 131-133 |
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| Authors: | XUE Wei ZHOU Dai-bing JIANG Yu-rong YU Zhi-nong LU Wei-qiang |
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| Affiliation: | Department of Optical Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing100081, China;Department of Optical Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing100081, China;Department of Optical Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing100081, China;Department of Optical Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing100081, China;Department of Optical Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing100081, China |
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| Abstract: | With screen-printing technique, a ceramic thick film substrate was fabricated by printing and sintering Ag/Pt alloy internal electrodes and high dielectric constant ceramic thick film insulating layer on Al 2O 3 ceramic substrate. Thereby a novel thick dielectric electro-luminescent (TDEL) device was prepared by using the ceramic thick film substrate. The whole structure of the device is ceramic substrate/internal electrodes/thick dielectric film/light-emitting layer/thin dielectric film/ITO. The threshold voltage and the dependence of brightness on voltage and frequency were measured, respectively. The decay characteristic of the device was also analyzed. Result shows that a thick film electroluminescent device has lower threshold voltage and less dielectric wastage than a thin film electroluminescent device. A TDEL device avoids cross phenomenon effectively. |
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| Keywords: | ceramic thick film insulator layer electroluminescence |
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