| 半导体激光器端面镀膜厚度的有效监控 |
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| 引用本文： | 李大义,卢玉村,陈建国,潘大任. 半导体激光器端面镀膜厚度的有效监控[J]. 四川大学学报(自然科学版), 1989, 0(3) |
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| 作者姓名： | 李大义 卢玉村 陈建国 潘大任 |
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| 作者单位： | 四川大学物理系(李大义，卢玉村，陈建国)，四川大学物理系(潘大任) |
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| 摘 要： | 行波式半导体激光放大器在未来光通讯系统中是极为重要的.研究表明,为实现行波放大,端面剩余反射率需低于1×10~(-3),这就需要在半导体激光器两端面(解理面)镀高效减反射膜,使其转变成激光放大器.而半导体激光器端面积仅10~(12)m~2量级,有源区的有效折射率又是一个不大容易确定的参数,要在这种器件上镀制高性能的
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EFFECTIVE MONITORING OF ANTIREFLECTION FILM THICKNESS COATED ON THE SEMICONDUCTOR LASER FACETS |
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| Li Dayi Lu Yucun Chen Jianguo Pan Daren. EFFECTIVE MONITORING OF ANTIREFLECTION FILM THICKNESS COATED ON THE SEMICONDUCTOR LASER FACETS[J]. Journal of Sichuan University (Natural Science Edition), 1989, 0(3) |
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| Authors: | Li Dayi Lu Yucun Chen Jianguo Pan Daren |
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| Affiliation: | Department of Physics |
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| Abstract: | After a brief account on the difficulties with the turning value monitoring of antirefle cton. film thickness coated on the semiconductor laser facets, we reported the principles and experimental set-up of monitoring the film thickness via detecting the light emitted from the laser diode itself. Measurement results have shown that a residual reflectivity of less than 5XlO-4 has been achieved. |
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| Keywords: | semiconductor laser antireflection coating monitoring. |
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