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Casimir Force Correction Between Parallel Polysilicon Plates
引用本文:丁建宁,孟永钢,温诗铸. Casimir Force Correction Between Parallel Polysilicon Plates[J]. 清华大学学报, 2002, 7(3)
作者姓名:丁建宁  孟永钢  温诗铸
作者单位:DING Jianning,MENG Yonggang,WEN Shizhu State Key Laboratory of Tribology,Department of Precision Instruments and Mechanology,Tsinghua University,Beijing 100084,China
基金项目:Supported by the Doctoral Science Foundation of China(No. 2 0 0 0 0 0 0 338)
摘    要:IntroductionIn 1 948Casimir predicted an attractive forcebetween two neutral metal plates.The force is dueto the metal boundaries altering the zero pointelectromagnetic energy E=Σ∞n (1 /2 ) hωn,wherehωn is the photon energy in each allowed photonmode n[1] .The Casimir effectis significantin someareas in the physics and cosmology of thin films,and may present strong restrictions on theconstants of hypothetical long- range interactions.Casimir equation combines the macroscopic and themicro…


Casimir Force Correction Between Parallel Polysilicon Plates
DING Jianning,MENG Yonggang,WEN Shizhu State Key Laboratory of Tribology. Casimir Force Correction Between Parallel Polysilicon Plates[J]. Tsinghua Science and Technology, 2002, 7(3)
Authors:DING Jianning  MENG Yonggang  WEN Shizhu State Key Laboratory of Tribology
Affiliation:DING Jianning,MENG Yonggang,WEN Shizhu State Key Laboratory of Tribology,Department of Precision Instruments and Mechanology,Tsinghua University,Beijing 100084,China
Abstract:Both the size of the components and the separation between them in some microelectromechanical systems (MEMS) are already in the sub-micrometer regime, where quantum mechanical effects such as the Casimir effect will need to be considered. This paper theoretically analyzes the roughness, electrical conductivity, and temperature corrections due to the Casimir force between two parallel polysilicon plates. The theoretical results show that the combined effects of roughness, conductivity and temperature cause a maximum relative error of the Casimir force per unit area of 26.2% between parallel polysilicon plates separated by 1 μm. Therefore, the surface roughness and finite conductivity corrections should be taken into account when calculating precise Casimir forces with separations on the order of 1 μm.
Keywords:Casimir force  polysilicon  microelectromechanical system (MEMS)
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