| 在红外系统上检测红外光斑 |
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| 引用本文： | 尹达人.在红外系统上检测红外光斑[J].南京理工大学学报(自然科学版),1996,20(2):159-162. |
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| 作者姓名： | 尹达人 |
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| 作者单位： | 南京理工大学信息学院,南京210094 |
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| 摘 要： | 国内外评定象质的主要方法是MTF方法，但是，在红外系统总调时，不适宜采用该方法。该文提出了测量红外光斑的频谱分析法，其光斑参数能从其测最到的谐波振幅谱中精确导出，它能在红外成象系统、红外跟踪系统、红外制导系统上精确．快速的测量高斯光斑参数，也可以测量非高斯成分的畸变参数。
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| 关 键 词： | 红外系统 光学元件 频谱分析 红外光斑 检测 |
| 修稿时间： | 1995-09-01 |
The Measuring IR Optical Spot on IR System |
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| Yin DaRen.The Measuring IR Optical Spot on IR System[J].Journal of Nanjing University of Science and Technology(Nature Science),1996,20(2):159-162. |
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| Authors: | Yin DaRen |
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| Abstract: | The measuring IR optical spot is of great importance to physics and technology. The chief method of evaluating image quality is MTF method, but manipulation of the IR system can not be performed by MTF method. A spectral analysis method for measuring IR optical spot is reported, and the parameters of the spot can be exactly derived from measuring the harmonic amplitude speetrum. It can be used for fast accurate measuring Gaussian soot, as well as measuring distortion parameters of non-Gaussian soot. |
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| Keywords: | infrared system optical elements frequency spectrum analysis IR optical spot |
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