基于条纹投影的三维轮廓测量新方法

针对条纹投影技术中提取物体高度比较复杂的问题,提出了一种光线跟踪法测量物体轮廓的新技术.利用投影物面即空间光调制器和成像面的相位对应关系,求出被测物体的高度.这种方法对系统结构没有平行性要求,也不需要对整个测量系统进行参数标定和复杂的坐标转换标定,而是用投影条纹图和成像条纹图的相位对应关系来得到空间投影直线和空间成像直线的方程,其交点就是物体的空间坐标.这是一种全场测量的方法,适合测量陡度小的静止物体,并通过实验论证了该方法具有测量速度快、工程上容易实现和测量精度稳定等优点.

New Method of Three-Dimensional Profile Measurement Based on Fringe Pattern Projection

Aimed at the difficulties of extracting the object heights in fringe pattern technology, a new measurement method with ray track was proposed. The corresponding phase relations of project plane SLM with image plane CCD were utilized to determine the measured object height, where it was unnecessary to arrange the system in parallel, to calibrate the parameters of the whole measurement system and to the translate coordinates. This method is suitable for the totally measured fields, and especially for the static and flat objects. The experiments confirm the higher measurement rate, fine flexibility and steady accuracy of this method.