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Characteristic finite difference fractional step methods for three-dimensional semiconductor device of heat conduction |
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| Authors: | Yirang Yuan |
| Institution: | (1) Institute of Mathematics, Shandong University, 250100 Jinan, China |
| Abstract: | The mathematical model of the semiconductor device of heat conduction has been described by a system of four equations. The optimal order estimates in L2 norm are derived for the error in the approximates solution, putting forward a kind of characteristic finite difference fractional step methods. |
| Keywords: | semiconductor device Three-dimensional heat conduction parallel characteristic finite differences fractional steps L2 error estimate |
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